Electronics Manufacturing worked example

Die Per Wafer at 66% usable die yield: a worked example

Here is what the math looks like when conditions slip. We hold every other input steady and drop usable die yield to 66%, then walk the calculation through step by step. Estimate effective die per wafer from candidate die count, wafer count basis, and usable die yield.

The inputs for this scenario

  • Candidate die count: 36,000 die (held at the documented default)
  • Wafers represented: 25 wafers (held at the documented default)
  • Usable die yield: 66 % (the input this scenario stresses; the baseline uses 92)

Working through the calculation

  • The calculation starts from the formula this tool documents: Candidate die per wafer = candidate die count รท wafers represented.
  • Effective die per wafer works out to 950 die / wafer at these inputs, and this is the headline figure for the scenario.
  • Candidate die per wafer works out to 1,440 die / wafer at these inputs.
  • Usable die count works out to 23,760 die at these inputs.
  • Wafers represented works out to 25 wafers at these inputs.

How this compares with the baseline

  • Against the tool's baseline example, where usable die yield sits at 92% and the headline result is 1,325 die / wafer, this scenario comes in 28.26% below the baseline at 950 die / wafer.
  • The practical read: the gap between this scenario and the baseline is entirely attributable to usable die yield, so recovering it is worth quantifying in dollars before considering equipment or staffing changes. It uses a flat yield percentage and a representative wafer average; it does not model edge-die exclusion geometry, radial yield gradients, or wafer-to-wafer variation directly.

Results at a glance

  • Effective die per wafer: 950 die / wafer (headline result)
  • Candidate die per wafer: 1,440 die / wafer
  • Usable die count: 23,760 die
  • Wafers represented: 25 wafers

Run it with your numbers

  • To rerun this with your own numbers, open the live Die Per Wafer calculator, set usable die yield to your actual value, and adjust the remaining inputs to match your operation.

Last reviewed 2026-05-12.