Implantable Electronics & Neurodevices worked example

Final Electrical Test Capacity at 63% final test station uptime: a worked example

Here is what the math looks like when conditions slip. We hold every other input steady and drop final test station uptime to 63%, then walk the calculation through step by step. Estimate good implantable devices per shift from tester throughput, planned cycles, uptime, and first-pass yield.

The inputs for this scenario

  • Devices tested per fixture cycle: 4 devices / cycle (held at the documented default)
  • Planned final test cycles: 96 cycles (held at the documented default)
  • Final test station uptime: 63 % (the input this scenario stresses; the baseline uses 88)
  • Final electrical test first-pass yield: 97 % (held at the documented default)

Working through the calculation

  • The calculation starts from the formula this tool documents: Gross final electrical test capacity = devices tested per fixture cycle × planned final test cycles.
  • Good final electrical test capacity works out to 235 devices at these inputs, and this is the headline figure for the scenario.
  • Gross final electrical test capacity works out to 384 devices at these inputs.
  • Final electrical test downtime loss works out to 142 devices at these inputs.
  • Final electrical test yield loss works out to 7.26 devices at these inputs.

How this compares with the baseline

  • Against the tool's baseline example, where final test station uptime sits at 88% and the headline result is 328 devices, this scenario comes in 28.41% below the baseline at 235 devices.
  • The practical read: the gap between this scenario and the baseline is entirely attributable to final test station uptime, so recovering it is worth quantifying in dollars before considering equipment or staffing changes. It models first-pass yield only; if your process relies on retest or rework to recover failed devices, true releasable output will differ from the first-pass figure.

Results at a glance

  • Good final electrical test capacity: 235 devices (headline result)
  • Gross final electrical test capacity: 384 devices
  • Final electrical test downtime loss: 142 devices
  • Final electrical test yield loss: 7.26 devices

Run it with your numbers

  • To rerun this with your own numbers, open the live Final Electrical Test Capacity calculator, set final test station uptime to your actual value, and adjust the remaining inputs to match your operation.

Last reviewed 2026-05-12.