Printed Electronics & Flexible Hybrid Electronics worked example
Conductive Trace Resistance at 65% first-pass trace yield: a worked example
This worked example runs the conductive trace resistance numbers for a tougher week than the baseline: 65% first-pass trace yield instead of the typical 90%. This tool tracks the effective production rate of conductive traces coming off a printed-electronics line once yield is taken into account.
The inputs for this scenario
- Conductive traces printed per run: 1,200 units (held at the documented default)
- Print-line run time: 8 hr (held at the documented default)
- First-pass trace yield: 65 % (the input this scenario stresses; the baseline uses 90)
Working through the calculation
- The calculation starts from the formula this tool documents: Raw conductive trace resistance = completed output รท runtime.
- Effective throughput works out to 97.5 units at these inputs, and this is the headline figure for the scenario.
- Raw throughput works out to 150 units at these inputs.
- Efficiency works out to 65 % at these inputs.
- Runtime works out to 8 hr at these inputs.
How this compares with the baseline
- Against the tool's baseline example, where first-pass trace yield sits at 90% and the headline result is 135 units, this scenario comes in 27.78% below the baseline at 97.5 units.
- Use it for capacity planning and line balancing when you need to know how many usable conductive traces you can actually deliver in a shift, not just how fast the printer moves. A result at this level usually justifies acting on the stressed input before touching anything else, because every other figure in the table is downstream of it.
Results at a glance
- Effective throughput: 97.5 units (headline result)
- Raw throughput: 150 units
- Efficiency: 65 %
- Runtime: 8 hr
Run it with your numbers
- To rerun this with your own numbers, open the live Conductive Trace Resistance calculator, set first-pass trace yield to your actual value, and adjust the remaining inputs to match your operation.
Last reviewed 2026-05-12.