Printed Electronics & Flexible Hybrid Electronics worked example
Test Yield at 68% target first-pass yield: a worked example
Suppose target first-pass yield falls to 68%. This page works the full calculation at that level so you can see exactly which result moves and by how much. Test yield is the share of printed or flexible hybrid electronic (FHE) circuits that pass electrical and functional test out of every unit tested in a run.
The inputs for this scenario
- Circuits passing electrical test: 8 units (held at the documented default)
- Circuits tested in the run: 250 units (held at the documented default)
- Target first-pass yield: 68 % (the input this scenario stresses; the baseline uses 95)
Working through the calculation
- The calculation starts from the formula this tool documents: Test Yield rate = affected amount รท total amount.
- Rate works out to 3.2 % at these inputs, and this is the headline figure for the scenario.
- Gap to target works out to 64.8 points at these inputs.
- Affected count works out to 8 count at these inputs.
- Total count works out to 250 count at these inputs.
How this compares with the baseline
- Against the tool's baseline example, where target first-pass yield sits at 95% and the headline result is 3.2 %, this scenario lands almost exactly on the baseline at 3.2 %.
- It computes the fraction of tested circuits that passed as a percentage, then reports how many points short of your target yield the run landed. When the numbers land here, the stressed input is the lever to work; the walkthrough above shows exactly how much each output recovers as it climbs back toward the baseline.
Results at a glance
- Rate: 3.2 % (headline result)
- Gap to target: 64.8 points
- Affected count: 8 count
- Total count: 250 count
Run it with your numbers
- To rerun this with your own numbers, open the live Test Yield calculator, set target first-pass yield to your actual value, and adjust the remaining inputs to match your operation.
Last reviewed 2026-05-12.