Printed Electronics & Flexible Hybrid Electronics worked example

Web Yield at 68% target yield or defect benchmark: a worked example

Here is what the math looks like when conditions slip. We hold every other input steady and drop target yield or defect benchmark to 68%, then walk the calculation through step by step. Web Yield measures the defect rate across a roll-to-roll printed electronics web and shows the gap between that rate and your target.

The inputs for this scenario

  • Defective prints on the web: 8 units (held at the documented default)
  • Total prints inspected on the web: 250 units (held at the documented default)
  • Target yield or defect benchmark: 68 % (the input this scenario stresses; the baseline uses 95)

Working through the calculation

  • The calculation starts from the formula this tool documents: Web Yield rate = affected amount รท total amount.
  • Rate works out to 3.2 % at these inputs, and this is the headline figure for the scenario.
  • Gap to target works out to 64.8 points at these inputs.
  • Affected count works out to 8 count at these inputs.
  • Total count works out to 250 count at these inputs.

How this compares with the baseline

  • Against the tool's baseline example, where target yield or defect benchmark sits at 95% and the headline result is 3.2 %, this scenario lands almost exactly on the baseline at 3.2 %.
  • The practical read: the gap between this scenario and the baseline is entirely attributable to target yield or defect benchmark, so recovering it is worth quantifying in dollars before considering equipment or staffing changes. A single rate treats all defects as equal and ignores clustering; a web with faults bunched at one edge can share the same rate as a uniformly scattered one but needs a very different fix.

Results at a glance

  • Rate: 3.2 % (headline result)
  • Gap to target: 64.8 points
  • Affected count: 8 count
  • Total count: 250 count

Run it with your numbers

  • To rerun this with your own numbers, open the live Web Yield calculator, set target yield or defect benchmark to your actual value, and adjust the remaining inputs to match your operation.

Last reviewed 2026-05-12.