Semiconductor Advanced Packaging & Test worked example

Final Test Throughput at 65% expected final test handler uptime: a worked example in semiconductor advanced packaging & test

Here is what the math looks like when conditions slip. We hold every other input steady and drop expected final test handler uptime to 65%, then walk the calculation through step by step. Estimate final test throughput for semiconductor advanced packaging and test using production-ready inputs so teams can confirm whether capacity can cover demand before committing the schedule.

The inputs for this scenario

  • Final test units handled per tester cycle: 4 units / cycle (held at the documented default)
  • Available final test handler cycles: 480 cycles (held at the documented default)
  • Expected final test handler uptime: 65 % (the input this scenario stresses; the baseline uses 90)
  • Expected final test first-pass yield: 97 % (held at the documented default)

Working through the calculation

  • The calculation starts from the formula this tool documents: Gross final test throughput capacity = final test throughput output per cycle × available final test throughput cycles.
  • Good final test throughput capacity works out to 1,211 units at these inputs, and this is the headline figure for the scenario.
  • Gross final test throughput capacity works out to 1,920 units at these inputs.
  • Final test throughput downtime loss works out to 672 units at these inputs.
  • Final test throughput yield loss works out to 37.44 units at these inputs.

How this compares with the baseline

  • Against the tool's baseline example, where expected final test handler uptime sits at 90% and the headline result is 1,676 units, this scenario comes in 27.78% below the baseline at 1,211 units.
  • The practical read: the gap between this scenario and the baseline is entirely attributable to expected final test handler uptime, so recovering it is worth quantifying in dollars before considering equipment or staffing changes. It assumes constant parallelism and yield; it ignores retest strategy, bin-dependent test time, handler jam variability, and socket contact degradation over a lot.

Results at a glance

  • Good final test throughput capacity: 1,211 units (headline result)
  • Gross final test throughput capacity: 1,920 units
  • Final test throughput downtime loss: 672 units
  • Final test throughput yield loss: 37.44 units

Run it with your numbers

  • To rerun this with your own numbers, open the live Final Test Throughput calculator, set expected final test handler uptime to your actual value, and adjust the remaining inputs to match your operation.

Last reviewed 2026-05-12.