Semiconductor Advanced Packaging & Test worked example

Wafer Sort Capacity at 65% expected wafer sort prober uptime: a worked example

This worked example runs the wafer sort capacity numbers for a tougher week than the baseline: 65% expected wafer sort prober uptime instead of the typical 90%. Estimate wafer sort capacity for semiconductor advanced packaging and test using production-ready inputs so teams can confirm whether capacity can cover demand before committing the schedule.

The inputs for this scenario

  • Wafer sort dies tested per prober cycle: 4 units / cycle (held at the documented default)
  • Available wafer sort prober cycles: 480 cycles (held at the documented default)
  • Expected wafer sort prober uptime: 65 % (the input this scenario stresses; the baseline uses 90)
  • Expected wafer sort first-pass yield: 97 % (held at the documented default)

Working through the calculation

  • The calculation starts from the formula this tool documents: Gross wafer sort capacity = wafer sort capacity output per cycle × available wafer sort capacity cycles.
  • Good wafer sort capacity works out to 1,211 units at these inputs, and this is the headline figure for the scenario.
  • Gross wafer sort capacity works out to 1,920 units at these inputs.
  • Wafer sort capacity downtime loss works out to 672 units at these inputs.
  • Wafer sort capacity yield loss works out to 37.44 units at these inputs.

How this compares with the baseline

  • Against the tool's baseline example, where expected wafer sort prober uptime sits at 90% and the headline result is 1,676 units, this scenario comes in 27.78% below the baseline at 1,211 units.
  • Use it for probe-cell capacity planning, load balancing across probers, and quoting achievable good-die volumes to fab planning. A result at this level usually justifies acting on the stressed input before touching anything else, because every other figure in the table is downstream of it.

Results at a glance

  • Good wafer sort capacity: 1,211 units (headline result)
  • Gross wafer sort capacity: 1,920 units
  • Wafer sort capacity downtime loss: 672 units
  • Wafer sort capacity yield loss: 37.44 units

Run it with your numbers

  • To rerun this with your own numbers, open the live Wafer Sort Capacity calculator, set expected wafer sort prober uptime to your actual value, and adjust the remaining inputs to match your operation.

Last reviewed 2026-05-12.