Semiconductor Advanced Packaging & Test worked example

Flip Chip Yield at 99% target flip chip yield: a worked example

What does the result look like when target flip chip yield reaches 99%? The full calculation is worked below with real intermediate numbers. Use it when flip chip yield in semiconductor advanced packaging and test needs a clean rate and gap-to-target you can put on a tier board.

The inputs for this scenario

  • Good flip chip units passing: 8 count (unchanged)
  • Total flip chip units assembled: 250 count (unchanged)
  • Target flip chip yield: 99 % (raised for this scenario; the documented default is 95)

Working through the calculation

  • Applying the documented formula (Flip chip yield rate = flip chip yield count ÷ total flip chip yield population × 100) to the inputs above produces each figure below.
  • At this operating point the engine returns 3.2 % for flip chip yield rate, the number this scenario is built around.
  • At this operating point the engine returns 95.8 points for flip chip yield gap to target.
  • At this operating point the engine returns 8 count for flip chip yield count.
  • At this operating point the engine returns 250 count for total flip chip yield population.

How this compares with the baseline

  • Against the tool's baseline example, where target flip chip yield sits at 95% and the headline result is 3.2 %, this scenario lands almost exactly on the baseline at 3.2 %.
  • A figure at this level is achievable when target flip chip yield is genuinely sustained, not just peaked for a shift. A single pass/fail ratio hides the defect Pareto; a low number tells you there is a problem but not whether it is bump bridging, non-wet, or underfill voiding.

Results at a glance

  • Flip chip yield rate: 3.2 % (headline result)
  • Flip chip yield gap to target: 95.8 points
  • Flip chip yield count: 8 count
  • Total flip chip yield population: 250 count

Run it with your numbers

  • Every input above is editable in the live Flip Chip Yield calculator, which recalculates instantly and can be shared with the inputs intact.

Last reviewed 2026-05-12.