Semiconductor Fab Equipment Manufacturing worked example

Particle Control Risk with contamination severity if it reaches the wafer of 3 score: a worked example

Suppose contamination severity if it reaches the wafer falls to 3 score. This page works the full calculation at that level so you can see exactly which result moves and by how much. Estimate particle control risk for semiconductor fab equipment manufacturing using production-ready inputs so teams can rank risks and decide which issue needs containment, controls, or escalation first.

The inputs for this scenario

  • Contamination severity if it reaches the wafer: 3 score (the input this scenario stresses; the baseline uses 6)
  • Likelihood of a particle excursion: 4 score (held at the documented default)
  • Detectability before shipment: 3 score (held at the documented default)

Working through the calculation

  • The calculation starts from the formula this tool documents: Particle control risk score = particle control risk severity score × particle control risk occurrence score × particle control risk detection score.
  • Particle control risk score works out to 3.35 score at these inputs, and this is the headline figure for the scenario.
  • Particle control risk severity score works out to 3 score at these inputs.
  • Particle control risk occurrence score works out to 4 score at these inputs.
  • Particle control risk detection score works out to 3 score at these inputs.

How this compares with the baseline

  • Against the tool's baseline example, where contamination severity if it reaches the wafer sits at 6 score and the headline result is 4.55 score, this scenario comes in 26.37% below the baseline at 3.35 score.
  • It computes a particle control risk priority number by multiplying severity, occurrence, and detection scores. When the numbers land here, the stressed input is the lever to work; the walkthrough above shows exactly how much each output recovers as it climbs back toward the baseline.

Results at a glance

  • Particle control risk score: 3.35 score (headline result)
  • Particle control risk severity score: 3 score
  • Particle control risk occurrence score: 4 score
  • Particle control risk detection score: 3 score

Run it with your numbers

  • To rerun this with your own numbers, open the live Particle Control Risk calculator, set contamination severity if it reaches the wafer to your actual value, and adjust the remaining inputs to match your operation.

Last reviewed 2026-05-12.